Using Grazing Incidence Small-Angle X-Ray Scattering (GISAXS) for Semiconductor Nanometrology and Defect Quantification

Views
Using ...110

Total Visits Per Month

April 2019May 2019June 2019July 2019August 2019September 2019October 2019November 2019December 2019January 2020February 2020March 2020April 2020May 2020June 2020July 2020August 2020September 2020October 2020November 2020December 2020January 2021February 2021March 2021
Using ...000000000000000000003453185

File Visits

Views
dissertation_pflueger_mika.pdf86

Top country views

Views
Germany51
United States27
Poland12
France5
Australia2
Turkey2
Austria1
Belize1
Canada1
China1

Top cities views

Views
Berlin28
Ashburn4
Kempen3
Duluth2
Elâzığ2
Houston2
Leipzig2
Melbourne2
Wuppertal2
Bochum1